When it comes to faster and accurate data, you can rely on Dynalene to provide high resolution micrographs, maps and a wide range of elemental analysis with combination of their new SEM and EDS.
Please contact us to find out more on how we can help you to fight corrosion.
The electron gun in the Scanning Electron Microscope produces a high energy electron beam which is focused through a number of electromagnetic lenses and apertures on to the specimen surface. The electron beam rasters on the specimen surface producing electron beam image. Specimen beam interaction produces secondary as well as back-scattered electron images. High magnification and high resolution (few nano-meters) images with high depth of field are produced by the SEM. Some sample preparation is required for insulating materials which can be damaged by the high energy electron beam. Low voltage imaging, use of variable pressure and also deposition of a thin conductive layer, can reduce the specimen charging in the chamber. Electrons have a shorter wavelength than visible light and there is a longer distance between the lens and the sample. This allows for the magnification of objects as small as 5-10nm yielding an image with enhanced resolution and greater depth of field.
Dynalene can test and analyze the surface of wide variety of materials: metals, ceramics and polymers, minerals, biological and geological materials and more. The scientists at Dynalene can assist you with wide variety of characterization including:
- Surface mapping including both topographical and compositional
- Particle, grain size measurement
- Film thickness determination
- Inclusion and segregation
- Types of corrosion and failure modes
When the high energy electron beam hits the specimen, electrons are knocked off from their orbitals which cause the electrons from the outer orbitals to fall to those empty positions. In this process, the high energy electrons emit a characteristic x-ray which acts like a finger-print for that particular element. By analyzing this X-ray, detectors can determine the elemental composition.
EDS is an important tool for bulk elemental analysis. With the Bruker Silicon Drift Detector (SDD), ~ 0.01 wt% of elemental detection is possible. Along with high energy peaks, low energy peaks from light elements are detected by the SDD. Qualitative and quantitative analysis as well as identification of unknown samples or inclusions is possible with this technique. Depending on your sample, Dynalene can provide you options for spot analysis, line scan and super-fast elemental mapping without damaging your sample.
Dynalene’s state-of-the-art Tescan Vega 3 Variable Pressure Scanning Electron Microscopy (SEM) with Secondary as well as Back-Scatter Electron Detector can provide faster topographical and compositional image acquisition and ultra-fast surface scanning. For samples with low conductivity, variable pressure mode and low voltage imaging are the perfect solution without the hiding the fine features under conductive coating.
Elemental identification, analysis and mapping have been made easy with high efficient Bruker Nano-Flash Solid State Detector (SDD). The SDD detector provides excellent energy resolution and extremely fast elemental mapping. There is option for spot analysis on particles, elemental line scan as well elemental surface mapping.
With the SEM and EDS capabilities, Dynalene can help you with Microstructural and Elemental Analysis including:
- Surface topography and microstructure
- Grain and particle size
- Film thickness
- Presence of inclusion and pores
- Elemental analysis of known and unknown particle and phases
- Elemental mapping on areas of interest
- Quantification of the elements present in your material